MetricViews call for articles: “New trends for how measuring software size contributes to answering questions about productivity and software value”

June 12, 2020 General MetricViews

The next MetricViews, the biannual IFPUG publication to be published in the last quarter of this year, will focus on the topic “New trends for how measuring software size contributes to answering questions about productivity and software value”.

The European Union has recently launched a big project tender which explicitly mentioned the use of Functional Size, both in software development and in enhancements. At the same time, COVID-19 has changed the way to work leading to many questions. For example, how can teams working from home measure the value they deliver and how working from home impact productivity? The need to measure the value IT delivers is strategic. This edition of MetricViews will examine trends and will focus on the importance of measuring software size to provide strategic information. IFPUG is soliciting articles based on this topic. This is your chance to share your knowledge and experiences.

Please submit your articles to [email protected]. Articles should not exceed more than 2000 words. If you are unsure if you have an acceptable topic, you can submit an abstract for prior approval. All articles will require a title, an author bio (approximately 125 words, including certifications such as CFPS or CFPP), and an author photo. All graphs/pictures included in the article must be high quality, the author must own the copyright of images and text, must have the authorization to publish the article (if the intellectual property is or could be owned by your employer, for example) and the submitted articles must not have been published in other media previously. IFPUG reserves the right to edit all articles for clarity, English grammar, and/or typographical errors.

Complete articles are due by 31 July 2020. The authors will be notified if their article has been accepted for this issue of MetricsViews after the receipt.